Hostname: page-component-5c6d5d7d68-tdptf Total loading time: 0 Render date: 2024-08-16T12:22:55.130Z Has data issue: false hasContentIssue false
  • English
  • Français

Ultra-High-Resolution Transmission Electron Microscopy of Atomically Thin Hexagonal Boron Nitride (h-BN)

Published online by Cambridge University Press:  01 August 2010

N Alem ,
R Erni ,
C Kisielowski ,
MD Rossell ,
W Gannett  and
A Zettl
N Alem
Affiliation:
University of California, Berkeley
R Erni
Affiliation:
Lawrence Berkeley National Laboratory
C Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory
MD Rossell
Affiliation:
Lawrence Berkeley National Laboratory
W Gannett
Affiliation:
University of California, Berkeley
A Zettl
Affiliation:
University of California, Berkeley

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 120 - 121
Copyright
Copyright © Microscopy Society of America 2010