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Ultrastructral Analysis of Synapse in a Drosophila of the Swedish Mutation which Causes Early-Onset Alzheimer's Disease using Focused Ion Beam Microscopy

Published online by Cambridge University Press:  08 April 2017

S Park ,
A Schertel  and
S Han
S Park
Affiliation:
Korea University, Korea
A Schertel
Affiliation:
Carl Zeiss NTS GmbH, Germany
S Han
Affiliation:
Korea University, Korea

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 216 - 217
Copyright
Copyright © Microscopy Society of America 2011