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Uncertainties in Secondary Fluorescence Correction in EPMA

Published online by Cambridge University Press:  05 August 2019

Mathias Procop  and
Vasile-Dan Hodoroaba
Mathias Procop
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, 12200 Berlin, Germany
Vasile-Dan Hodoroaba
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, 12200 Berlin, Germany

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2360 - 2361
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Heinrich, K F J, Electron Beam X-ray Microanalysis (van Nostrand, New York, 1981).Google Scholar
[2]Reed, S J B, Electron Microprobe Analysis, 2nd ed. (Cambridge University Press, 1993)Google Scholar
[3]Ritchie, N W M, Microsc Microanal 23 (2017), p. 1.Google Scholar
[4]Buse, B, Microsc Microanal 24 (2018), p. 604.Google Scholar
[5]Pouchou, J-L and Pichoir, F in “Electron Beam Quantitation”, ed. Heinrich, K F J and Newbury, D E, (Plenum Press, New York), p. 31.Google Scholar
[6]Bastin, G F, Dijkstra, J M and Heijligers, H J M, X-ray Spectrometry 27 (1998), p. 3.Google Scholar
[7]Procop, M, Microsc Microanal 10 (2004), p. 481.Google Scholar
[8]Casnati, E, Tartari, A and Baraldi, C, J Phys B 15 (1982), p. 155.Google Scholar
[9]Green, M and Cosslett, V E, Brit J Appl Phys (J Phys D) ser. 2, 2 (1968), p. 425.Google Scholar
[10]Bote, D et al. , Atomic Data Nuclear Data Tables 95 (2009), p. 871.Google Scholar