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Under-sampling and Image Reconstruction for Scanning Electron Microscopes

Published online by Cambridge University Press:  04 August 2017

Yan Zhang ,
G.M. Dilshan Godaliyadda ,
Youssef S. G. Nashed ,
Nicola Ferrier ,
Emine Begum Gulsoy  and
Charudatta Phatak
Yan Zhang
Affiliation:
Material Science Division, Argonne National Laboratory, Lemont, IL, USA
G.M. Dilshan Godaliyadda
Affiliation:
Material Science Division, Argonne National Laboratory, Lemont, IL, USA School of ECE, Purdue University, West Lafayette, IN, USA
Youssef S. G. Nashed
Affiliation:
Mathematics and Computer Science Division, Argonne National Laboratory, Lemont, IL, USA
Nicola Ferrier
Affiliation:
Mathematics and Computer Science Division, Argonne National Laboratory, Lemont, IL, USA
Emine Begum Gulsoy
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
Charudatta Phatak
Affiliation:
Material Science Division, Argonne National Laboratory, Lemont, IL, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 136 - 137
Copyright
© Microscopy Society of America 2017 

References

[1] Stevens, A., et al, Microscopy 63 2014). p. 41.CrossRefGoogle Scholar
[2] Sang, X., et al, Advanced Structural and Chemical Imaging 2 2016). p. 1.CrossRefGoogle Scholar
[3] Oxvig, C. S., et al, Ultramicroscopy 172 2017). p. 1.CrossRefGoogle Scholar
[4] Krizhevsky, Alex & Hinton, G. Convolutional deep belief networks on cifar-10. Unpublished manuscript 40(( 2010). Images downloaded from: https://www.cs.toronto.edu/~kriz/cifar.html.Google Scholar
[5] Inouye, H., et al, Scientific Reports 4 2014). p. 3756.CrossRefGoogle Scholar
[6] The authors acknowledge funding from Laboratory-Directed Research and Development (LDRD) at Argonne National Laboratory. SEM images are collected with Dr. Lee Makowski at Northeastern University.Google Scholar