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Understanding Interphase Boundary Dynamics by In Situ High-Resolution and Energy-Filtering Transmission Electron Microscopy and Real-Time Image Simulation

Published online by Cambridge University Press:  28 July 2005

J.M. Howe
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903-2442
T.M. Murray
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903-2442
K.T. Moore
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903-2442
A.A. Csontos
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903-2442
M.M. Tsai
Affiliation:
Materials Technology Division, Heraeus Incorporated, 301 North Roosevelt Avenue, Chandler, AZ 85226
A. Garg
Affiliation:
Materials Division, NASA Lewis Research Center, 21000 Brookpark Road, Cleveland, OH 44135
W.E. Benson
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903-2442
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Abstract

This study discusses the use of in situ high-resolution transmission electron microscropy (HRTEM) techniques to determine the structure, composition, and interphase boundary dynamics during phase transformations at the atomic level. Three main in situ HRTEM techniques are described: (1) in situ HRTEM dynamic studies that are performed on the same precipitate plates from different viewing directions to determine the three-dimensional structure of the interfaces; (2) in situ compositional mapping of precipitate interfaces obtained by energy-filtering TEM experiments at temperature in a HRTEM, and (3) real-time HRTEM image simulations that are being created for comparison with and interpretation of experimental in situ HRTEM dynamic observations. The results from these studies demonstrate that it is possible to understand the mechanisms and kinetics of interphase boundary motion at the atomic level.

Type
1998 ASU ELECTRON MICROSCOPY WORKSHOP
Copyright
© 2005 Microscopy Society of America

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