Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Xu, Michael
Kumar, Abinash
and
LeBeau, James
2021.
Automating Electron Microscopy through Machine Learning and USETEM.
Microscopy and Microanalysis,
Vol. 27,
Issue. S1,
p.
2988.
Kalinin, Sergei V.
Ziatdinov, Maxim
Hinkle, Jacob
Jesse, Stephen
Ghosh, Ayana
Kelley, Kyle P.
Lupini, Andrew R.
Sumpter, Bobby G.
and
Vasudevan, Rama K.
2021.
Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy.
ACS Nano,
Vol. 15,
Issue. 8,
p.
12604.
Groschner, Catherine K.
Choi, Christina
and
Scott, Mary C.
2021.
Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data.
Microscopy and Microanalysis,
Vol. 27,
Issue. 3,
p.
549.
Xu, Michael
Kumar, Abinash
and
LeBeau, James M
2022.
Towards Augmented Microscopy with Reinforcement Learning-Enhanced Workflows.
Microscopy and Microanalysis,
Vol. 28,
Issue. 6,
p.
1952.
Zhu, Xiaoyang
Mao, Yu
Liu, Jizi
Chen, Yi
Chen, Chuan
Li, Yan
Huang, Xiao
and
Gu, Ning
2023.
Deep learning-assisted analysis of HRTEM images of crystalline nanoparticles.
Nanoscale,
Vol. 15,
Issue. 35,
p.
14496.