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Use of HfC(310) as a High Brightness Electron Sources for Advanced Imaging Applications
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 48 - 49
- Copyright
- Copyright © Microscopy Society of America 2014
References
[2]
Swanson, L.W. and Schwind, G.A. in Handbook of Charged Particle Optics, edited by J. Orloff (CRC, Boca Raton, FL 1997), Chap. 2, pp. 77-102.Google Scholar
[3] www.a-p-tech.com.Google Scholar
[4] The authors acknowledge that financial support was provided in part by Air Force Research Laboratory (AFRL). Joe Hancock is thanked for electronic and vacuum system support.Google Scholar