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Use of Multilayer Correction Procedures to Improve the Quantitative Electron Microprobe Analyses of Coated Insulating Specimens

Published online by Cambridge University Press:  26 July 2009

J Armstrong
J Armstrong*
Affiliation:
Carnegie Institution of Washington

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 514 - 515
Copyright
Copyright © Microscopy Society of America 2009