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Use of Secondary Ions Mass Spectrometry (SIMS) for Cladding Materials Post-Irradiation Examination (PIE)

Published online by Cambridge University Press:  27 August 2014

S. Portier ,
N. Mine  and
M. Martin
S. Portier
Affiliation:
Paul Scherrer Institute, Hot Laboratory Division, Villigen, Switzerland
N. Mine
Affiliation:
Paul Scherrer Institute, Hot Laboratory Division, Villigen, Switzerland
M. Martin
Affiliation:
Paul Scherrer Institute, Hot Laboratory Division, Villigen, Switzerland

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1802 - 1803
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Motta, A. T.and Chen, L. Q. J.O.M. (Journal of the Minerals, Metals & Materials Society), vol. 64 (2012), p. 1403.Google Scholar
[2] Bart, G., Gebhardt, O., Aerne, E.T.and Martin, M. IAEA TECDOC-822 (1995), p. 337.Google Scholar
[3] Lutz, D., Lin, Y.-P., Dunavant, R., Schneider, R., Yeager, H., Kucuk, A., Cheng, B. andLemons, J. ASTM 17th International Symposium on Zirconium in the Nuclear Industry (2013).Google Scholar
[4] Mine, N., Portier, S., Martin, M. accepted in Surf. Interface. Anal (2013).Google Scholar
[5] The authors acknowledge funding from the PSI-FELLOW program, Grant agreement no.: 290605, and GNF and EPRI for the fruitful collaboration on irradiate cladding SIMS analyses.Google Scholar