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Utilizing Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM) for Failure Analysis of Char Deposits Obtained From Space Shuttle Columbia Window Debris

Published online by Cambridge University Press:  08 April 2017

M Wright ,
R Christoffersen ,
Z Rahman  and
S McDanels
M Wright
Affiliation:
NASA
R Christoffersen
Affiliation:
Jacobs Technology
Z Rahman
Affiliation:
Jacobs Technology
S McDanels
Affiliation:
NASA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1762 - 1763
Copyright
Copyright © Microscopy Society of America 2011