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Valence Electron Energy-Loss Spectroscopy as a Tool for In Situ Diagnostics of Materials Properties

Published online by Cambridge University Press:  24 July 2003

Vladimir P. Oleshko  and
James M. Howe
Vladimir P. Oleshko
Affiliation:
University of Virginia, Department of Materials Science & Engineering, Charlottesville, VA 22904
James M. Howe
Affiliation:
University of Virginia, Department of Materials Science & Engineering, Charlottesville, VA 22904

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 918 - 919
Copyright
Copyright © Microscopy Society of America 2003