Hostname: page-component-84b7d79bbc-x5cpj Total loading time: 0 Render date: 2024-07-26T17:32:33.431Z Has data issue: false hasContentIssue false
  • English
  • Français

What is the Best Beam Energy for X-Ray Microanalysis of Nanomaterials in Electron Microscopy?

Published online by Cambridge University Press:  26 July 2009

R Gauvin ,
P Michaud  and
ML Trudeau
R Gauvin
Affiliation:
McGill University
P Michaud
Affiliation:
McGill University
ML Trudeau
Affiliation:
Centre de Recherche dHydro-Québec,Canada

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 460 - 461
Copyright
Copyright © Microscopy Society of America 2009