No CrossRef data available.
Article contents
White Beam Differential Phase and Dark Field Imaging at High Resolution
Published online by Cambridge University Press: 10 August 2018
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS143192761801317X/resource/name/firstPage-S143192761801317Xa.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 156 - 157
- Copyright
- © Microscopy Society of America 2018
References
[9] M. E. was supported by the Royal Academy of Engineering under the RAEng Research Fellowships scheme. We thank Elettra Sincrotrone Trieste for access to SYRMEP beam line (Proposal No. 20170069) that contributed to the results presented here.Google Scholar