Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T15:27:30.869Z Has data issue: false hasContentIssue false
  • English
  • Français

XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.

Published online by Cambridge University Press:  25 July 2016

D. Surman ,
C. Moffitt ,
A. J. Roberts ,
S. J. Coultas ,
J. D. P. Counsell  and
C. J. Blomfield
D. Surman
Affiliation:
Kratos Analytical Inc., 100 Red Schoolhouse Road, Chestnut Ridge, NY
C. Moffitt
Affiliation:
Kratos Analytical Inc., 100 Red Schoolhouse Road, Chestnut Ridge, NY
A. J. Roberts
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
S. J. Coultas
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
J. D. P. Counsell
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
C. J. Blomfield
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 380 - 381
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Smith, E.F., Briggs, D. & Fairley, N. Surf. Interface Anal. (2005) 38, 69–75.CrossRefGoogle Scholar
[2] Walton, J. & Fairley, N. Surf. Interface Anal. (2008) 40, 478–481.CrossRefGoogle Scholar
[3] Barlow, A.J., Scott, O., Sano, N. & Cumpson, P.J. Surf. Interface Anal. (2015) 47, 173–175.CrossRefGoogle Scholar