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X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

Published online by Cambridge University Press:  27 August 2014

Hendrix Demers ,
Nicolas Brodusch ,
Richard Wuhrer ,
Ken Moran ,
Patrick Woo  and
Raynald Gauvin
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Richard Wuhrer
Affiliation:
Advanced Materials Characterisation Facility, University of Western, Sydney, NSW, Australia
Ken Moran
Affiliation:
Moran Scientific Pty Ltd, Bungonia, NSW, Australia
Patrick Woo
Affiliation:
Hitachi High-Technologies Canada Inc., Toronto, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 676 - 677
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Zaluzec, N. J. Microscopy Today 17 (2009), pp. 56-59.Google Scholar
[2] Demers, H., et al, Microscopy and microanalysis 19 (2013), pp. 364-365.Google Scholar
[3] Demers, H., et al, Microscopy and microanalysis 19 (2013), pp. 1250-1251.Google Scholar