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The Analytical Limits: HADF (High Angle Dark Field Imaging)

Published online by Cambridge University Press:  14 March 2018

Michael Kersker*
Affiliation:
JEOL USA

Extract

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High Angle Dark Field Imaging, or Z contrast imaging, is an Imaging method. It takes advantage of the useful fact that if one uses the high angle scattering intensities and eliminates the elastic scattered (diffracted) beams from the image (by using a Howie type angular dark field detector), the remaining image will be characterized by, if the probe used is on the order of the atomic dimensions, intensity modulations that reveal atom positions and relative atomic number. In simple terms, the image will display Z-contrast at the atomic level and can differentiate columns of heavy atoms from columns of lighter ones.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 1996

References

Browing, N.D., Chisholm, M.F. and Pennycook, S.J. (1993) Atomic Resolution Chemical Analysis Using a Scanning Transmission Electron Microscope, Nature, 366, 143–146.Google Scholar
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Pennycook, S.J., Jesson, D.E., Chisholm, M.F., Browing, N.D., McGibbon, A.J. and McGibbon, (1995), M.M., ZContrast Imaging in the Scanning Transmission Electron Microscope, Journal of the Microscopy Society of America, Vol 1, Number 6, 231-251.Google Scholar