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Applications for Automated Particle Analysis

Published online by Cambridge University Press:  14 March 2018

Robert Anderhalt  and
Lara Swenson
Robert Anderhalt*
Affiliation:
EDAX Inc., Mahwah, NJ
Lara Swenson
Affiliation:
EDAX Inc., Mahwah, NJ
*
bob.anderhalt@ametek.com

Extract

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Electron microscopy and x-ray microanalysis are common techniques in many research, development and quality labs (Garratt-Reed and Bell, 2002; Goldstein et al., 2003). As systems become ever more automated, as well as easy to use, new applications for the use of these systems develop and expand. One such application is particle analysis. These “particles” might be small loose fragments that can be applied to a conductive adhesive or a filter, embedded in epoxy and polished, or they can be inclusions within collect an EDS spectrum.

Type
Research Article
Information
Microscopy Today , Volume 14 , Issue 5 , September 2006 , pp. 22 - 27
Copyright
Copyright © Microscopy Society of America 2006

References

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Laskin, A., and Cowin, J.P., 2001, Automated single-particle SEM/EDXanalysis of submicrometer particles down to 0.1 μm, Anal. Chem., vol. 73, p.1023–1029.Google Scholar
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