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A Combined In-situ and Electron Tomography Holder for (S)TEM

Published online by Cambridge University Press:  14 March 2018

C. Mitterbauer ,
N.D. Browning  and
Pushkarraj V. Deshmukh
C. Mitterbauer*
Affiliation:
Department of Chemical Engineering & Materials Science, University of California, Davis, CA
N.D. Browning
Affiliation:
Department of Chemical Engineering & Materials Science, University of California, Davis, CA Chemistry and Materials Science, Lawrence Livermore National Laboratory, Livermore, CA
Pushkarraj V. Deshmukh
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA
*
cjmitterbauer@ucdavis.edu

Extract

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Recent advances in in-situ and tomographic methods using (scanning) transmission electron microscopy ((S)TEM) provide the unique possibility of obtaining 3-dimensional (3D) information and in-situ studies of gas-solid chemical reactions on the nanometer scale. In combination with the well-known analytical techniques, electron energy-loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy (EDXS) we can obtain 3D, dynamic, analytical, and structural information down to the atomic level.

The JEOL JEM-2500SE STEM/TEM at UC Davis (CHMS) is equipped with a Schottky field-emission source operated at 200 kV, a post column Gatan imaging filter (863 GIF Tridiem) for EELS and a Thermo System Six for EDXS.

Type
Research Article
Information
Microscopy Today , Volume 15 , Issue 1 , January 2007 , pp. 34 - 35
Copyright
Copyright © Microscopy Society of America 2007

References

[1] Arslan, I., Yates, T.J.V., Browning, N.D. and Midgley, P.A, Science 309 (2005) 2195–2198.Google Scholar
[2] Gai, P.L., Microsc. Microanal. 8 (2002) 21–28.CrossRefGoogle Scholar