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Is a Cs Corrector Necessary for Lorentz Vector Field Tomography?

Published online by Cambridge University Press:  14 March 2018

Charudatta Phatak  and
Marc De Graef
Charudatta Phatak
Affiliation:
Carnegie Mellon University, Pittsburgh
Marc De Graef*
Affiliation:
Carnegie Mellon University, Pittsburgh
*
cd@cmu.edu

Extract

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Magnetic recording media based on patterned shapes are promising for applications in high density data storage. Optimizing the design of the patterned arrays requires characterization of the particle shapes and their relative locations, and the magnetostatic interactions between particles. To achieve this, one must determine the three dimensional (3D) magnetic induction in and around the nano magnets. We propose a method based on Vector Field Electron Tomography coupled with phase reconstructed Lorentz Microscopy to determine the 3D magnetic induction. This method can be broken down into two steps 1) Determination of the magnetic phase shift of the electron wave using phase reconstructed Lorentz microscopy and 2) Reconstruction (in 3D) of the magnetic induction in and around the magnetic particle using Vector Field Electron Tomography (VFET). First, we will discuss the theoretical development of VFET and then the importance of spherical aberration (Cs) correctors for Lorentz microscopy.

Type
Research Article
Information
Microscopy Today , Volume 15 , Issue 6 , November 2007 , pp. 24 - 27
Copyright
Copyright © Microscopy Society of America 2007

References

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[6] This work was supported by the U.S Department of Energy, Basic Energy Sciences under contract number DE-FG02-01ER45893.Google Scholar