Lateral Force Microscopy (LFU) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. It is one of several techniques developed as extensions to the basic topographical mapping capabilities of SPM. LFM is particularly useful for differentiating among materials on surfaces. Applications include identifying transitions between different components in polymer blends, composites and other mixtures, identifying organic and other contaminants on surfaces, delineating coverage by coatings and other surface layers, and chemical force microscopy using functionalized tips.