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Low Voltage Scanning Electron Microscopy and Jack Ramsey's principle
Published online by Cambridge University Press: 14 March 2018
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“Low Voltage Scanning Electron Microscopy (LVSEM), defined as operation in the energy range below 5 keV” was described by David Joy and Dale Newbury (1) in the previous issue of this journal as being “perhaps the most important single operational mode of the SEM.” In their paper they describe both the advantages and disadvantages of this method.
Ramsey's principle, which was established by Jack Ramsey over many years as a microscopist and microanalyst, is to say: “There is no best way of doing ANYTHING.”
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- Research Article
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- Copyright © Microscopy Society of America 2002
References
(1)
Joy, D.C., Newbury, D.E., (2002), ‘Low Voltage Scanning Electron Microscopy’ Microscopy Today March/April 2002, p. 22 only.CrossRefGoogle Scholar
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