More Sample Preparation for SEM and X-ray Microanalysis

Don Chernoff

doi:10.1017/S1551929500062623

Our systems are now restored following recent technical disruption, and we’re working hard to catch up on publishing. We apologise for the inconvenience caused. Find out more: https://www.cambridge.org/universitypress/about-us/news-and-blogs/cambridge-university-press-publishing-update-following-technical-disruption

Skip to main content Accessibility help

More Sample Preparation for SEM and X-ray Microanalysis

Published online by Cambridge University Press: 14 March 2018

Don Chernoff

Show author details

Don Chernoff*: Affiliation:
Small World

Article contents

Abstract

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'

Type: Other
Information: Microscopy Today , Volume 3 , Issue 6 , August 1995 , pp. 30

DOI: https://doi.org/10.1017/S1551929500062623 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 1995

Reply to: Submit a response

Title * Please enter a title for your response.

Contents * Please enter your response.

Your details

First name * Please enter your first name.

Last name * Please enter your last name.

Please enter a valid email address.

Occupation Please enter your occupation.

Affiliation Please enter any affiliation.

You have entered the maximum number of contributors

Conflicting interests

Do you have any conflicting interests? * Conflicting interests help

Yes No

More information * Please enter details of the conflict of interest or select 'No'.

Please tick the box to confirm you agree to our Terms of use. *

Please accept terms of use.

Please tick the box to confirm you agree that your name, comment and conflicts of interest (if accepted) will be visible on the website and your comment may be printed in the journal at the Editor’s discretion. *

Please confirm you agree that your details will be displayed.

Article contents

More Sample Preparation for SEM and X-ray Microanalysis

Abstract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests