Hostname: page-component-848d4c4894-8bljj Total loading time: 0 Render date: 2024-07-07T07:24:50.061Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanomechanical Probing With Scanning Force Microscopy

Published online by Cambridge University Press:  14 March 2018

V. V. Tsukruk  and
V. V. Gorbunov
V. V. Tsukruk*
Affiliation:
Iowa State University
V. V. Gorbunov
Affiliation:
Iowa State University
*
vladimir@iastate.edu

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Highly localized probing of surface nanomechanical properties with a submicron resolution can be accomplished with scanning probe microscopy (SPM). The SPM ability to probe local surface topography in conjunction with mechanical, adhesive, friction, thermal, magnetic, and electric properties is unique.1 However, the quantitative probing of the nanomechanical materials properties is still a challenge and only a few examples have been published to date.

In this note, we briefly review the latest developments in the nanomechanical probing of compliant materials (predominantly polymers). We solely focus our analysis of SPM-based approach in a so-called static force spectroscopy (SFS) mode.

Type
Research Article
Information
Microscopy Today , Volume 9 , Issue 1 , January 2001 , pp. 8 - 15
Copyright
Copyright © Microscopy Society of America 2001

References

1. Sarid, D., Scanning Force Microscopy, Oxford University Press, New York, 1991.Google Scholar
2. Chizhik, S. A., Huang, Z., Gorbunov, V. V., Myshkin, N. K., Tsukruk, V. V., Langmuir, 14, 2606, 1998.Google Scholar
3. Tsukruk, V. V., Huang, Z., Chizhik, S. A., Gorbunov, V. V., J. Mater. Sci. Lett., 33, 4905, 1998.Google Scholar
4. Vanlandingham, M. R., McKnight, S. H., Palmese, G. R., Eduljee, R. F., Gillespie, J. W., McCulough, R. J., J. Mat. Sci. Lett, 16, 117, 1997.Google Scholar
5. Phart, G. M., Oliver, W. C., Brotzen, F. B., J. Mater. Res., 7, 613, 1992.Google Scholar
6. Johnson, K. L., Kendall, K., Roberts, A. D., Proc. R. Soc, London, A324, 301, 1971.Google Scholar
7. Tsukruk, V. V., Huang, Z., Polymer, 41, 5541, 2000.Google Scholar
8. Tsukruk, V. V., Gorbunov, V. V., Huang, Z., Chizhik, S. A., Polymer Intern. 49, 441, 2000.Google Scholar
9. Hazel, J. L., Tsukruk, V. V., Thin Solid Films, 339, 249, 1999.Google Scholar
10. Gorbunov, V. V., Tsukruk, V. V., Probe Microscopy, in preparationGoogle Scholar