Hostname: page-component-77c89778f8-rkxrd Total loading time: 0 Render date: 2024-07-24T06:15:26.649Z Has data issue: false hasContentIssue false
  • English
  • Français

Nondestructive, High-Resolution Materials Characterization with the Confocal Raman-AFM

Published online by Cambridge University Press:  14 March 2018

U. Schmidt ,
A. Jauss ,
W. Ibach ,
K. Weishaupt  and
O. Hollricher
U. Schmidt*
Affiliation:
WITec GmbH, Ulm, Germany
A. Jauss
Affiliation:
WITec GmbH, Ulm, Germany
W. Ibach
Affiliation:
WITec GmbH, Ulm, Germany
K. Weishaupt
Affiliation:
WITec GmbH, Ulm, Germany
O. Hollricher
Affiliation:
WITec GmbH, Ulm, Germany
*
ute.schmidt@witec.de

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Materials research, biomedical research, and semiconductor manufacturing can all benefit from nondestructive, high-resolution methods of analysis. As most materials are heterogeneous, it is important to not only acquire high resolution topographic information, but also to identify the chemical composition of samples. A combination of high resolution microscopy with chemically sensitive spectroscopy combined in one instrument allows the detailed characterization of samples with different analytical techniques. When individual instruments are used, returning to a previously surveyed sample area can be very time consuming if not impossible without surface markers.

Type
Research Article
Information
Microscopy Today , Volume 13 , Issue 3 , May 2005 , pp. 30 - 35
Copyright
Copyright © Microscopy Society of America 2005

References

1. Siesler, H. W. and Holland-Moritz, K., Infrared and Raman Spectroscopy of Polymers, ed. Marcel Dekker, New York (1990).Google Scholar
2. Sokrates, G., Infrared and Raman Characteristic Group Frequencies Table and Charts, Wiley (2001)).Google Scholar
3. Boerio, R J., Bahl, S. K., and McGraw, G. E., J. Polym. Sci., Polym. Phys. Edn. 14, 1029 (1976).Google Scholar
4. Wilson, T., Confocal Microscopy, Academic Press, London (1990).Google Scholar
5. Binning, G., Quate, C. R, and Gerber, Ch., Phys. Rev. Lett. 56, 930 (1986).Google Scholar