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Techniques for Combinatorial and High-Throughput Microscopy Part 2: Automated Optical Microscopy Platform for Thin Film Research

Published online by Cambridge University Press:  14 March 2018

S.-W. Kim ,
A. Sehgal ,
A. Karim  and
M.J. Fasolka
S.-W. Kim
Affiliation:
Polymers Division, National Institutes of Standards and Technology
A. Sehgal
Affiliation:
Polymers Division, National Institutes of Standards and Technology
A. Karim
Affiliation:
Polymers Division, National Institutes of Standards and Technology
M.J. Fasolka*
Affiliation:
Polymers Division, National Institutes of Standards and Technology
*
mfasolka@nist.gov

Extract

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As it is in traditional materials science, microscopy is a central tool for morphology characterization in combinatorial and high-throughput (C&HT) materials research. Indeed, micrographs are naturally amenable to C&HT studies, since they enable rapid visual screening and automated quantitative analysis by a plethora of well-tested image processing routines. In this article, we present a custom-built and cost-effective automated optical microscopy (AOM) platform designed for the C&HT analysis of gradient specimens. Gradient specimens progressively vary one or more parameters with position, presenting a multitude of experimental conditions within a single sample (see Part 1 of this series).

Type
Research Article
Information
Microscopy Today , Volume 11 , Issue 6 , December 2003 , pp. 30 - 33
Copyright
Copyright © Microscopy Society of America 2003

References

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