The National Cryo-Electron Microscopy Facility (NCEF) at the National Cancer Institute was launched in May of 2017 to provide free and rapid access to high-resolution cryo-EM data collection to United States researchers working on problems of broad general relevance to cancer biology. The decision about suitability of projects for data collection is made on a first-come, first-served basis by NCEF staff and is based solely on the quality of the screening images provided, without need for a scientific proposal. Here we provide an overview of the operation of the facility, typical data collection procedures, and some insights that have emerged from the structures reported from data collected at the facility.

In this report, atomic force microscopy (AFM) nanolithography and electrochemical anodic oxidation using bias-assisted lithography are used to created oxide patterns on the surface of a silicon substrate. Non-contact mode imaging was conducted after the lithography process to confirm the successful fabrication of oxide patterns on the surface as well as to distinguish the surface difference between the oxide layers and silicon substrate. With only a few seconds of run time, oxide patterns as narrow as 35 nm in width were created illustrating that the bias mode in the Park Scientific SmartLitho software can be used to generate well-defined nanoscale patterns and features.

Order, in the sense of arrangement, structure, coordination, or sequence, arises in many fields and at all scales. It is found with varying degrees of perfection in many if not most subjects for microscopy, can take many forms, and can be challenging to recognize or to measure. A variety of examples are provided that are intended to make the reader more aware of the possibilities.