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Silver Growth on AFM Tip Apexes from Silver Nitrate Solutions Triggered by Focused-Ion-Beam Irradiation

Published online by Cambridge University Press:  06 June 2016

Masayuki Nishi ,
Daisuke Teranishi ,
Hiroki Itasaka ,
Masahiro Shimizu  and
Kazuyuki Hirao
Masayuki Nishi*
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 615-8510, Japan
Daisuke Teranishi
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 615-8510, Japan
Hiroki Itasaka
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 615-8510, Japan
Masahiro Shimizu
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 615-8510, Japan
Kazuyuki Hirao
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 615-8510, Japan
*
*(Email: west@collon1.kuic.kyoto-u.ac.jp)
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Abstract

Silver nanostructures are directly grown on the apex of commercially available silicon AFM probes using our area-selective electroless deposition: the apex of a silicon AFM probe is irradiated using a focused ion beam (FIB), and then the FIB-irradiated AFM probe is exposed to a pure AgNO3 aqueous solution. With this method, a silver nanostructure selectively grows on the tip apex where the native oxide layer has been removed in response to FIB irradiation. Silver ions are reduced by the electrons flowing from the silicon probes into the solution through the FIB-irradiated area owing to the difference in Fermi energy between silicon and the solution. The morphology of the growing silver depends on the concentration of both AgNO3 and the electrons. The growth of a gold nanoflower is also demonstrated on the apex of a silicon AFM probe.

Keywords

Agnanostructureion-beam processing
Type
Articles
Information
MRS Advances , Volume 1 , Issue 25: Theory, Characterization, and Modeling , 2016 , pp. 1865 - 1869
Copyright
Copyright © Materials Research Society 2016 

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References

REFERENCES

Stöckle, R. M., Suh, Y. D., Deckert, V., and Zenobi, R., Chem. Phys. Lett. 318, 131 (2000).Google Scholar
Hayazawa, N., Inouye, Y., Sekkat, Z., and Kawata, S., Opt. Commun. 183, 333 (2000).Google Scholar
Anderson, M. S., Appl. Phys. Lett. 76, 3130 (2000).Google Scholar
Pettinger, B., Picardi, G., Schuster, R., and Ertl, G., Electrochemistry 68, 942 (2000).Google Scholar
Zhang, R., Zhang, Y., Dong, Z. C., Jiang, S., Zhang, C., Chen, L. G., Zhang, L., Liao, Y., Aizpurua, J., Luo, Y., Yang, J. L., and Hou, J. G., Nature 498, 82 (2013).Google Scholar
Stadler, J., Schmid, T., and Zenobi, R., ACS Nano, 5, 8442 (2011).CrossRefGoogle Scholar
Hartschuh, A., Sánchez, E. J., Xie, X. S., and Novotny, L., Phys. Rev. Lett., 90 095503 (2003).Google Scholar
Wang, H., Tian, T., Zhang, Y., Pan, Z., Wang, Y., and Xiao, Z., Langmuir, 24, 8918 (2008).Google Scholar
Fleischer, M., Weber-Bargioni, A., Altoe, M. V. P., Schwartzberg, A. M., Schuck, P. J., Cabrini, S., and Kern, D. P., ACS Nano, 5, 2570 (2011).Google Scholar
Umakoshi, T., Yano, T., Saito, Y., and Verma, P., Appl. Phys. Express, 5, 052001 (2012).CrossRefGoogle Scholar
Itasaka, H., Nish, M., Shimizu, M., and Hirao, K., MRS proceedings 1748, mrsf14-1748-ii11-02 (2015).Google Scholar
Itasaka, H., Nishi, M., Shimotsuma, Y., Miura, K., Watanabe, M., Jain, H., and Hirao, K., J. Ceram. Soc. Jpn., 122, 543 (2014).CrossRefGoogle Scholar
Itasaka, H., Nishi, M., and Hirao, K., Jpn. J. Appl. Phys. 53, 06JF06 (2014).Google Scholar