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All inorganic quantum dot light emitting devices with solution processed metal oxide transport layers

Published online by Cambridge University Press:  15 February 2016

R. Vasan ,
H. Salman  and
M. O. Manasreh
R. Vasan*
Affiliation:
Department of Electrical Engineering, University of Arkansas, Fayetteville, AR, USA-72701
H. Salman
Affiliation:
Microelectronics and Photonics program, University of Arkansas, Fayetteville, AR, USA-72701
M. O. Manasreh
Affiliation:
Department of Electrical Engineering, University of Arkansas, Fayetteville, AR, USA-72701
*
*(Email: rvasan@email.uark.edu)
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Abstract

All inorganic quantum dot light emitting devices with solution processed transport layers are investigated. The device consists of an anode, a hole transport layer, a quantum dot emissive layer, an electron transport layer and a cathode. Indium tin oxide coated glass slides are used as substrates with the indium tin oxide acting as the transparent anode electrode. The transport layers are both inorganic, which are relatively insensitive to moisture and other environmental factors as compared to their organic counterparts. Nickel oxide acts as the hole transport layer, while zinc oxide nanocrystals act as the electron transport layer. The nickel oxide hole transport layer is formed by annealing a spin coated layer of nickel hydroxide sol-gel. On top of the hole transport layer, CdSe/ZnS quantum dots synthesized by hot injection method is spin coated. Finally, zinc oxide nanocrystals, dispersed in methanol, are spin coated over the quantum dot emissive layer as the electron transport layer. The material characterization of different layers is performed by using absorbance, Raman scattering, XRD, and photoluminescence measurements. The completed device performance is evaluated by measuring the IV characteristics, electroluminescence and quantum efficiency measurements. The device turn on is around 4V with a maximum current density of ∼200 mA/cm2 at 9 V.

Keywords

optoelectronicoxideluminescence
Type
Articles
Information
MRS Advances , Volume 1 , Issue 4: Electronics and Photonics , 2016 , pp. 305 - 310
Copyright
Copyright © Materials Research Society 2016 

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References

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