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Fabrication of CsPbBr3 Thick Films by Using a Mist Deposition Method for Highly Sensitive X-ray Detection

Published online by Cambridge University Press:  13 January 2020

Yuki Haruta ,
Takumi Ikenoue Open the ORCID record for Takumi Ikenoue [Opens in a new window] ,
Masao Miyake  and
Tetsuji Hirato
Yuki Haruta
Affiliation:
Graduate School of Energy Science, Kyoto University Kyoto, 606-8501, Japan
Takumi Ikenoue*
Affiliation:
Graduate School of Energy Science, Kyoto University Kyoto, 606-8501, Japan
Masao Miyake
Affiliation:
Graduate School of Energy Science, Kyoto University Kyoto, 606-8501, Japan
Tetsuji Hirato
Affiliation:
Graduate School of Energy Science, Kyoto University Kyoto, 606-8501, Japan
*
*(Email: ikenoue.takumi.4m@kyoto-u.ac.jp)
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Abstract

X-ray imaging is a valuable technique used for medical imaging and non-destructive inspection of industrial products. However, the radiation may put humans at risk of developing cancer. Consequently, highly sensitive X-ray detectors, which enable X-ray imaging at a low dose rate, are required. Metal halide perovskite materials have demonstrated excellent X-ray detection performance including a high sensitivity owing to their high absorption coefficient, high carrier mobility, and long carrier lifetime. However, perovskite thick films with a large area, which is essential to realize the application of such materials to X-ray imaging devices have not been extensively investigated. To this end, in this study, a polymer is employed as a buffer layer to avoid film exfoliation, which makes it difficult to fabricate perovskite thick films, and a 110-μm-thick CsPbBr3 film is successfully obtained using a scalable solution method. In addition, an X-ray detector based on the CsPbBr3 thick film is fabricated, which demonstrates a sensitivity of 11,840 μC Gyair–1 cm–2. This sensitivity is approximately 600 times higher than that of the existing commercial a-Se X-ray detectors.

Keywords

perovskitesdevicesfilm
Type
Articles
Information
MRS Advances , Volume 5 , Issue 8-9: Energy and Environment , 2020 , pp. 395 - 401
Copyright
Copyright © Materials Research Society 2020

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