Hardness Measurements of Silicon Nanospheres Yield Values Four Times that for Bulk Silicon

Kinson C. Kam

doi:10.1557/mrs2003.112

Last updated 09/07/24: Online ordering is currently unavailable due to technical issues. We apologise for any delays responding to customers while we resolve this. For further updates please visit our website: https://www.cambridge.org/news-and-insights/technical-incident

Skip to main content Accessibility help

Hardness Measurements of Silicon Nanospheres Yield Values Four Times that for Bulk Silicon

Published online by Cambridge University Press: 31 January 2011

Kinson C. Kam

Article contents

Abstract

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'

Type: Research/Researchers
Information: MRS Bulletin , Volume 28 , Issue 6: Materials Science of Adhesives: How to Bond Things Together , June 2003 , pp. 408

DOI: https://doi.org/10.1557/mrs2003.112 [Opens in a new window]
Copyright: Copyright © Materials Research Society 2003

Reply to: Submit a response

Title * Please enter a title for your response.

Contents * Please enter your response.

Your details

First name * Please enter your first name.

Last name * Please enter your last name.

Please enter a valid email address.

Occupation Please enter your occupation.

Affiliation Please enter any affiliation.

You have entered the maximum number of contributors

Conflicting interests

Do you have any conflicting interests? * Conflicting interests help

Yes No

More information * Please enter details of the conflict of interest or select 'No'.

Please tick the box to confirm you agree to our Terms of use. *

Please accept terms of use.

Please tick the box to confirm you agree that your name, comment and conflicts of interest (if accepted) will be visible on the website and your comment may be printed in the journal at the Editor’s discretion. *

Please confirm you agree that your details will be displayed.

Article contents

Hardness Measurements of Silicon Nanospheres Yield Values Four Times that for Bulk Silicon

Abstract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests