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1 / F Noise Measurements of Interacting Current Filaments in Hydrogenated Amorphous Silicon

Published online by Cambridge University Press:  01 January 1993

C.E. Parman ,
N.E. Israeloff ,
J. Fan  and
J. Kakalios
C.E. Parman
Affiliation:
The University of Minnesota,School of Physics and Astronomy, Minneapolis, MN 55455, USA
N.E. Israeloff
Affiliation:
The University of Minnesota,School of Physics and Astronomy, Minneapolis, MN 55455, USA
J. Fan
Affiliation:
The University of Minnesota,School of Physics and Astronomy, Minneapolis, MN 55455, USA
J. Kakalios
Affiliation:
The University of Minnesota,School of Physics and Astronomy, Minneapolis, MN 55455, USA
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Abstract

The coplanar current in n-lype doped hydrogenated amorphous silicon (a-Si:H) displays random telegraph switching noise, indicating the presence of inhomogeneous current filaments whose conductance varies with time. There are strong correlations of the 1/f noise power spectra across differing frequency octaves which are much larger than expected if the magnitudes of the fluctuators are varied in parallel. The scale invariant second spectra and the temperature dependence of the spectral slope indicate that hydrogen motion is involved in the cooperative dynamics between noise sources. A model is described wherein the properties of the current filaments are modulated by hydrogen-hydrogen interactions which are mediated by the Si strain fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 297: Symposium A – Amorphous Silicon Technology - 1993 , 1993 , 309
Copyright
Copyright © Materials Research Society 1993

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References

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