Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T17:23:20.674Z Has data issue: false hasContentIssue false
  • English
  • Français

1/60 Sec. Time-Resolved High-Resolution Electron Microscopy of Surface-Diffusion of Tungsten Atoms on MgO (001) Surfaces

Published online by Cambridge University Press:  15 February 2011

N. Tanaka ,
H. Kimata  and
T. Kizuka
N. Tanaka
Affiliation:
Department of Applied Physics, School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464–01, Japan
H. Kimata
Affiliation:
Department of Applied Physics, School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464–01, Japan
T. Kizuka
Affiliation:
Department of Applied Physics, School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464–01, Japan
Get access

Abstract

Surface diffusion process of tungsten(W)-atoms on MgO (001) surfaces was studied by high-resolution electron microscopy (HREM) in the time resolution of 1/60 s. The W-atoms were prepared on single crystalline MgO (001) films at 300°C by vacuumdeposition of WO3 or W-metal. Analysis of the recorded images revealed individual jump-process of the W-atoms in the substrate temperature from R.T. to 400°C, and gave the barrier potential (Ed) and the pre-exponential factor (D0). The diffusion processes on terraces and along steps were also compared in viewpoint of the jump length.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 404: Symposium J – In Situ Electron and Tunneling Microscopy of Dynamic Processes , 1995 , 37
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Zangwill, A., Physics at Surfaces, Cambridge University Press, Cambridge (1988), Chapter 14.Google Scholar
2. Ayrault, G. and Ehrlich, G., Phys. Rev. Lett., 31, 1407 (1973).Google Scholar
3. Ganz, E., Theiss, S. K., Hwang, I-S. and Golovchenko, J., Phys. Rev. Lett., 68, 1567 (1992).Google Scholar
4. Mo, Y. M., Phys. Rev. Lett., 71, 2423 (1993).Google Scholar
5. Iijima, S. and Ichihashi, T., Phys. Rev. Lett., 56, 616 (1986).Google Scholar
6. Kizuka, T. and Tanaka, N., Philo. Mag. Lett., 69, 135 (1994)Google Scholar
7. Tanaka, N., Kimata, H. and Kizuka, T., Surf. Rev. Lett., in print (1995).Google Scholar
8. Tanaka, N., Kizuka, T., Naruse, M. and Yanagisawa, T., Proc. 13th Int. Cong. E.M. (Paris) (1994), Vol. 2A, 381.Google Scholar
9. Tanaka, N., Kimata, H. and Kizuka, T., Thin Solid Films, in print (1995).Google Scholar
10. Iijima, S., OPTIK,48, 193 (1977).Google Scholar
11. Tanaka, N., Nagao, M. and Mihama, K., Ultramicrosc., 25, 241(1988).Google Scholar
12. Tanaka, N., Kizuka, T. and Kizuka, T., Mater. Sci. Eng., B19, 53 (1993).Google Scholar
13. Kimoto, K., Tanaka, N. and Mihama, K., J. Electron Microsc., 38, 165 (1989).Google Scholar
14. Tanaka, N., Kimata, H. and Kizuka, T., J. Electron Microsc., (1996) in print.Google Scholar
15. Einstein, A., Investigation on the Theory of Brownian Movement, Dover, New York, (1956).Google Scholar
16. Kingery, W. D., Bowen, H. K. and Uhlmann, D. R.: Introduction to Ceramics, John Wiley & Sons, New York, (1976), Chapter 6.Google Scholar
17. Feibelman, P. J. and Knotek, M. L., Phys. Rev. B18, 6531 (1978).Google Scholar
18. Ganz, E., Theiss, S. K., Hwang, I. S. and Golovchenko, J., Phys. Rev. Lett., 68, 1567 (1992).Google Scholar