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1/f Dielectric Fluctuations at the Glass Transition

Published online by Cambridge University Press:  10 February 2011

N. E. Israeloff  and
W. Wang
N. E. Israeloff
Affiliation:
Department of Physics and Center for Interdisciplinary Research on Complex Systems, Northeastern University, Boston, MA 02115
W. Wang
Affiliation:
Department of Physics and Center for Interdisciplinary Research on Complex Systems, Northeastern University, Boston, MA 02115
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Abstract

The temperature and frequency dependence of thermal dielectric polarization noise was investigated in glycerol and PVC in the vicinity of their glass transitions. Polarization fluctuations were observed via voltage noise which was produced within a sample capacitance cell. The high sensitivity and accuracy of the technique provides a powerful probe of dynamics in low-loss regimes of various materials. Noise spectra had 1/fβ form at lower temperatures just below the glass transition. In glycerol, the spectral exponent decreased smoothly with temperature, extrapolating to 1, i.e. 1/f noise, near T° where relaxation times diverge. The results support the idea that a glassy phase transition occurs in the static limit.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 455: Symposium T – Glasses and Glass Formers–Current Issues , 1996 , 253
Copyright
Copyright © Materials Research Society 1997

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References

1. Angell, C. A., Science 267, 1924 (1995) and following articles in the same issue.Google Scholar
2. Dixon, P. K., et. al., Phys. Rev. Lett. 65, 1108 (1990).Google Scholar
3. Menon, Narayanan and Nagel, Sydney R., Phys. Rev. Lett. 74, 1230 (1995), S.R. Nagel, private communication.Google Scholar
4. Israeloff, N. E., Phys. Rev. B53, R11913 (1996).Google Scholar
5. Israeloff, N. E., and Wang, W., Rev. Sei. Inst, in press.Google Scholar
6. Cugliandolo, L. F. and Kurchan, J., Phys. Rev. Lett. 71, 173 (1993).Google Scholar
7. Weissman, M. B., Rev. Mod. Phys. 60, 537 (1988).Google Scholar
8. Israeloff, N. E., Weissman, M. B., Nieuwenhuys, G. J., and Kosiorowska, J., Phys. Rev. Lett. 63, 794 (1989);Google Scholar
Israeloff, N. E., Alers, G. B., and Weissman, M. B., Phys. Rev. B 44 (Rapid Comm.), 12613 (1991).Google Scholar
9. Ocio, M., Bouchiat, H., and Monod, P., J. Physique Lett. L–647 (1985);Google Scholar
Reim, W., Koch, R., Malozemoff, A. P., Ketchen, M. B., and Maletta, H., Phys. Rev. Lett. 57, 905 (1987);Google Scholar
Bouchiat, H. and Ocio, M., Comments Cond. Mat. Phys. 14, 163 (1988) and ref. theirin.Google Scholar
10. Birge, N. O., Phys. Rev. B 34, 1631 (1986).Google Scholar