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Atom-Probe Field-Ion Microscopy of Grain Boundary Segregation

Published online by Cambridge University Press:  28 February 2011

L. V. Alvensleben  and
P. Haasen
L. V. Alvensleben
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-5, D–3400 Göttingen and Sonderforschungsbereich 126, Göttingen/Clausthal, F.R.G.
P. Haasen
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-5, D–3400 Göttingen and Sonderforschungsbereich 126, Göttingen/Clausthal, F.R.G.
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Abstract

Grain boundary analysis with the help of atom-probe field-ion microscopy (APFIM) needs an aimed tip-preparation technique unless the grain size of the material is very small. With the help of a dedicated FIM-tipholder for the TEM the distance grain boundary-apex is determined and reduced by a controlled backpolishing method to make the grain boundary accessible to APFIM analysis. Tilt angle and tilt axis of the grain boundary were determined analyzing the Kikuchi diagrams of the two grains. In nickel 1 at% carbon some atoms image “brighter” than others. With the help of the drop of the detector current it can be shown that these atoms are carbon. With the help of this feature the distribution of the carbon atoms in the matrix can directly be determined in the FIM. A segregation of carbon at grain boundaries was detected with the atomprobe.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 479
Copyright
Copyright © Materials Research Society 1989

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