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The Charge Carriers Transport Mechanism Through the Interface Layer of the p-GaSe(Cu)/n+GaAs Heterojunctions
Published online by Cambridge University Press: 01 February 2011
Abstract
The photoelectrical properties of p-GaSe(Cu)/n-GaAs heterojunctions obtained by optically contacting the components and by thermal evaporation of GaSe, have been studied. The rectification factor for optically contacted heterojunctions is ∼2·102 at 5 V, and the current flow is determined by diffusion mechanism. The diffusion and recombination through the interface defects mechanisms determine de current flow for heterojunctions formed by GaSe evaporation.
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- Copyright © Materials Research Society 2007