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Compositional Microstructure and Micromagnetics of Co-Based Thin Film Media

Published online by Cambridge University Press:  10 February 2011

M. Futamoto ,
N. Inaba ,
Y. Hirayama ,
K. Ito  and
Y. Honda
M. Futamoto
Affiliation:
Central Research Laboratory, Hitachi Ltd.Kokubunji, Tokyo 185, Japan, futamoto@crl.hitachi.co.jp
N. Inaba
Affiliation:
Central Research Laboratory, Hitachi Ltd.Kokubunji, Tokyo 185, Japan, futamoto@crl.hitachi.co.jp
Y. Hirayama
Affiliation:
Central Research Laboratory, Hitachi Ltd.Kokubunji, Tokyo 185, Japan, futamoto@crl.hitachi.co.jp
K. Ito
Affiliation:
Central Research Laboratory, Hitachi Ltd.Kokubunji, Tokyo 185, Japan, futamoto@crl.hitachi.co.jp
Y. Honda
Affiliation:
Central Research Laboratory, Hitachi Ltd.Kokubunji, Tokyo 185, Japan, futamoto@crl.hitachi.co.jp
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Abstract

Elemental segregation of CoCrTa and CoCrPt thin films for longitudinal and perpendicular media is investigated using high spacial resolution transmission electron microscopes equipped with compositional analysis facilities. Strong Cr segregation exceeding 20 at% within 1.5-2 nm width is observed along the grain boundaries for both types of CoCrTa films prepared at elevated substrate temperatures. Weaker Cr segregation is observed along the grain boundaries of the longitudinal and the perpendicular CoCrPt films. The strong Cr segregation at grain boundaries is related with the small magnetic cluster size and the low media noise characteristics of CoCrTa thin film media. The Cr content inside the grain is several % lower than the average composition of the CoCrTa films. The magnetocrystalline anisotropy constants(Ku) for different Cr compositions are determined using single crystalline thin film technology to discuss the thermal stability of recorded information.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 517: Symposium F – Wide Bandgap Semiconductors for High Power, High Frequency , January 1998 , 243
Copyright
Copyright © Materials Research Society 1998

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