Hostname: page-component-84b7d79bbc-g5fl4 Total loading time: 0 Render date: 2024-07-30T22:21:32.827Z Has data issue: false hasContentIssue false
  • English
  • Français

Concentration and Distribution of ER, AL and P in Silica-Based Optical Fiber Preforms by Sims

Published online by Cambridge University Press:  21 February 2011

D. W. Oblas ,
T. Wei ,
W. J. Miniscalco  and
B. T. Hall
D. W. Oblas
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
T. Wei
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
W. J. Miniscalco
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
B. T. Hall
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
Get access

Abstract

Secondary ion mass spectrometry (SIMS) was used to measure the Er, Al and P distributions across (perpendicular to) and along (parallel to) the axis of Er3+-doped silica based preforms and fibers prepared by a solution doping technique. Specially prepared low-melting silicate glass standards containing known concentrations of Er were used to calibrate the spectrometer to obtain a semi-quantitative measurement of the Er concentration. It was found that the Er concentration can vary along a 4-cm section of the preform by as much as a factor of two. The Al concentration also changed along the length of the preform, but to a smaller degree. Finally, instrumental limitations for measuring the Er, Al and P distributions in the optical fiber samples were determined.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 172: Symposium P – Optical Fiber Materials and Processing , 1989 , 315
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Payne, D.N. and Reekie, L., Tech. Digest, European Conf. Opt. Commun., 49 (1988).Google Scholar
2. Urquhart, P., lEE Proc. 135, Pt. J, 385 (1988).Google Scholar
3. Ainslie, B.J., Craig, S.P., Davey, S.T. and Wakefield, B., Mater. Lett 6, (5,6) 139 (1988).Google Scholar
4. Ainslie, B.J., Craig, S.P., Wyatt, R. and Moulding, K., Mater. Lett. 8, (6,7) 204 (1989).Google Scholar
5. Ainslie, B.J., Armitage, J.R., Craig, S.P. and Wakefield, B., Tech. Digest, European Conf. Opt. Commun., 62 (1988).Google Scholar
6. Suyama, M., Nakamura, K., Kashiwa, S. and Kuwahara, H., Tech, Digest., Opt. Fiber Commun. Conf., paper PD6 (1989).Google Scholar
7. Storms, H. A., Brown, K.F. and Stein, J.D., Anal. Chem. 49, 2023 (1977).Google Scholar
8. Schreiner, M., J. Am. Ceram. Soc. 72, (9) 1713 (1989).Google Scholar
9. Townsend, J.E., Poole, S.B. and Payne, D.N., Electron. Lett. 23, 329 (1987).Google Scholar
10. Volf, M.B., Technical Glasses, pp. 90–91, Sir Isaac Putnam & Sons, London (1961).Google Scholar