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Contact-Free Determination of Scattering Times in Heterojunction Device Structures

Published online by Cambridge University Press:  25 February 2011

P. Omling ,
H. Linke ,
P. Ramvall  and
B. K. Meyer
P. Omling
Affiliation:
Department of Solid State Physics, University of Lund, Box 118, S-221 00 Lund, Sweden
H. Linke
Affiliation:
Department of Solid State Physics, University of Lund, Box 118, S-221 00 Lund, Sweden
P. Ramvall
Affiliation:
Department of Solid State Physics, University of Lund, Box 118, S-221 00 Lund, Sweden
B. K. Meyer
Affiliation:
Physikdepartment E16, TU München, James Franck Str., D-8046 Garching, FRG.
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Abstract

In this paper we present contact-free measurement techniques which are important for the evaluation of heterojunctions of interest for optical as well as high-speed devices. The techniques are the microwave-detection of Shubnikov-de Haas oscillations, photoluminescence-detected magneto-oscillations, and optically detected cyclotron resonance using microwaves (ODCR) as well as far-infrared lasers (FIR-ODCR). The techniques are illustrated by several examples, and the possibilities to determine 2D carrier concentrations, effective masses, and scattering times in the heterojunction structures are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 281: Symposium D – Semiconductor Heterostructures for Photonic and Electronic Applications , 1992 , 115
Copyright
Copyright © Materials Research Society 1993

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References

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