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Copper oxide nanoparticles for thin film photovoltaics

Published online by Cambridge University Press:  27 February 2013

Maurice Nuys ,
Jan Flohre ,
Christine Leidinger ,
Florian Köhler  and
Reinhard Carius
Maurice Nuys
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Jan Flohre
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Christine Leidinger
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Florian Köhler
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Reinhard Carius
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
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Abstract

Commercially available tenorite (CuO) nanoparticles (NPs) were investigated in particular with respect to their suitability for photovoltaic applications. NPs with a diameter of about 30 nm were step wise annealed up to 1000°C in nitrogen atmosphere. The influence of the annealing treatment on the structural and electronic properties was investigated by Raman, photoluminescence (PL) and photothermal deflection spectroscopy (PDS) as well as X-ray diffraction measurements. Size, shape, and phase of the untreated NPs are analyzed by TEM measurements. The PL and PDS results show a strong increase of the tenorite band edge emission at about 1.3 eV accompanied by a decreasing sub gap absorption with increasing annealing temperature up to 700°C. According to literature, a phase transition from tenorite to cuprite (Cu2O) was expected and observed after annealing at 800°C. Strong cuprite band edge emission at about 2 eV accompanied by very weak defect and possibly tenorite band edge emission was found for samples annealed at 800°C and 1000°C.

Keywords

nanostructureoptical propertiesphotovoltaic
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1494: Symposium F – Oxide Semiconductors and Thin Films , 2013 , pp. 333 - 338
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Koffyberg, F. P., and Benko, F. A., Journal of Applied Physics 53(2), 1173 (1982)CrossRefGoogle Scholar
Roos, A., and Karlsson, B., Solar Energy Materials 7, 467 (1983)CrossRefGoogle Scholar
Grun, J.B., Sieskind, M., and Nikitine, S., Journal of Physics and Chemistry of Solids 19, 819 (1961)CrossRefGoogle Scholar
Elliott, R., Physical Review 124, 340 (1961)CrossRefGoogle Scholar
Grondahl, L.O., and Geiger, P.H., J. Am. Inst. Elec. Eng. 46, 215 (1927)Google Scholar
Rai, B.P., Solar Cells 25(3), 265 (1988)CrossRefGoogle Scholar
Meyer, B.K. et al. ., Physica status solidi (b), 1 (2012)Google Scholar
Jackson, W.B., Amer, N.M., Boccara, A.C., and Fournier, D., Applied Optics 20, 1333 (1981)CrossRefGoogle Scholar
Asbrink, S., and Norrby, L.J., Acta Cryst. B26, 8 (1970)CrossRefGoogle Scholar
Chrzanowski, J., and Irwin, J.C., Solid State Communications 70, 11 (1989)CrossRefGoogle Scholar
Reydellet, J., Phys. Stat. Sol.(b) 52, 175 (1972)CrossRefGoogle Scholar
Balzar, D., Voigt-function model in diffraction line-broadening analysis. – Microstructure Analysis from Diffraction, edited by Snyder, R.L., Bunge, H.J., and Fiala, J., International Union of Crystallography, (1999)Google Scholar
Bruker AXS TOPAS V4: General profile and structure analysis software for powder diffraction data (2008) Google Scholar
Weichman, F.L., and Reyes, J.M., Canadian Journal of Physics 58, 325 (1980)CrossRefGoogle Scholar
Snoke, D.W., Shields, A.J., and Cardona, M., Phys. Rev. B 45, 693 (1992)Google Scholar
Bloem, J., Van der Houven van Oordt, A.J., and Kröger, F.A., Physica 22, 1254 (1956)CrossRefGoogle Scholar
Ito, T., and Masumi, T., J. Phys. Soc. Jpn. 66, 2185 (1997)CrossRefGoogle Scholar