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Critical Transport and Magnetization of La0.67Ca0.3MnO3

Published online by Cambridge University Press:  15 February 2011

G. Jeffrey Snyder ,
R. Hiskes ,
S. DiCarolis ,
M. R. Beasley  and
T. H. Geballe
G. Jeffrey Snyder
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA 94305–4090
R. Hiskes
Affiliation:
Hewlett-Packard, Palo Alto, California 94303–0867
S. DiCarolis
Affiliation:
Hewlett-Packard, Palo Alto, California 94303–0867
M. R. Beasley
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA 94305–4090
T. H. Geballe
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA 94305–4090
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Abstract

The critical magnetic properties of bulk La0.67Ca0.3MnO3 and magnetoresistance of a thin film with the same Tc were measured and critical exponents determined. The magnetization data can be scaled with β = 0.3 and γ = 0.9, except above Tc which appears to be affected by a region where X3 (M = XH + X3H3) is positive. An M2 dependence of the magnetoconducitvity is observed above Tc. Below Tc, however, such a correspondence between the critical magnetic and transport behavior is not found.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 453: Symposium R – Solid State Chemistry of Inorganic Materials , 1996 , 337
Copyright
Copyright © Materials Research Society 1997

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References

[1] Snyder, G. J., Hiskes, R., DiCarolis, S., Beasley, M. R., and Geballe, T. H., Phys. Rev. B 53, 14434 (1996).Google Scholar
[2] Brug, J. A., Anthony, T. C., and Nickel, J. H., MRS Bulletin 21(9), 23 (1996).Google Scholar
[3] O'Donnell, J., Onellion, M., Rzchowski, M. S., Eckstein, J. N., and Bozovic, I., Phys. Rev. B (1996).Google Scholar
[4] Tokura, Y., Urushibara, A., Moritomo, Y., Arima, T., Asamitsu, A., Kido, G., and Furukawa, N., J. Phys. Soc. Jpn. 63, 3931 (1994).Google Scholar
[5] Hundley, M. F., Hawley, M., Heffner, R. H., Jia, Q. X., Neumeier, J. J., Tesmer, J., Thompson, J. D., and Wu, X. D., Appl. Phys. Lett. 67, 860 (1995).Google Scholar
[6] Snyder, G. J., Hiskes, R., DiCarolis, S., Beasley, M. R., and Geballe, T. H., Appl. Phys. Lett, (in press).Google Scholar
[7] Worledge, D. C., Snyder, G. J., Hiskes, R., DiCarolis, S., Beasley, M. R., and Geballe, T. H., J. Appl. Phys. (in press).Google Scholar