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Development of a Novel Combined Scanning Electrochemical Microscope (SECM) and Scanning Ion-Conductance Microscope (SICM) Probe for Soft Sample Imaging

Published online by Cambridge University Press:  16 March 2012

Andrew J. Pollard ,
Nilofar Faruqui ,
Michael Shaw ,
Charles A. Clifford ,
Yasufumi Takahashi ,
Yuri E. Korchev ,
Neil Ebejer ,
Julie V. Macpherson ,
Patrick R. Unwin  and
Debdulal Roy
Andrew J. Pollard
Affiliation:
National Physical Laboratory, Teddington, TW11 0LW, UK
Nilofar Faruqui
Affiliation:
National Physical Laboratory, Teddington, TW11 0LW, UK
Michael Shaw
Affiliation:
National Physical Laboratory, Teddington, TW11 0LW, UK
Charles A. Clifford
Affiliation:
National Physical Laboratory, Teddington, TW11 0LW, UK
Yasufumi Takahashi
Affiliation:
Division of Medicine, Imperial College, London, W12 0NN, UK
Yuri E. Korchev
Affiliation:
Division of Medicine, Imperial College, London, W12 0NN, UK
Neil Ebejer
Affiliation:
Department of Chemistry, University of Warwick, Coventry, CV4 7AL, UK
Julie V. Macpherson
Affiliation:
Department of Chemistry, University of Warwick, Coventry, CV4 7AL, UK
Patrick R. Unwin
Affiliation:
Department of Chemistry, University of Warwick, Coventry, CV4 7AL, UK
Debdulal Roy
Affiliation:
National Physical Laboratory, Teddington, TW11 0LW, UK
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Abstract

By incorporating a localized heating system within a scanning ion-conductance microscopy (SICM) system, we have performed stable ‘hopping-mode’ (HPICM) imaging for live cells maintained at temperatures ranging up to human body temperature. This allows the accurate study of cell volume and morphology variation versus temperature over extended periods of time. The integration of SICM with scanning electrochemical microscopy (SECM) provides the simultaneous mapping of electrochemical and topographic information for soft samples, such as live cells. This combined technique overcomes the limitations of resolution and topographical artifacts typically associated with SECM. However, previously reported SECM-SICM probe production required expensive and time-consuming focused ion beam (FIB) methods and produced pipettes that are typically hundreds of nanometers in diameter. We report a simple and rapid production method for SECM-SICM double-barrel probes with apertures down to 20 nm in diameter. The characterization of these SECM-SICM probes using scanning electron microscopy (SEM) imaging, cyclic voltammetry (CV) and Raman spectroscopy is also detailed. These SECM-SICM probes were subsequently used to study the morphology and electrochemical activity of several samples, ranging from hard metallic/insulating samples to live cells.

Keywords

morphologyscanning probe microscopy (SPM)biological
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1422: Symposium QQ – Functional Imaging of Materials–Advances in Multifrequency and Multispectral , 2012 , mrsf11-1422-qq07-04
Copyright
Copyright © Materials Research Society 2012

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References

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