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Diamond Photodiodes for X-ray Applications

Published online by Cambridge University Press:  31 January 2011

John Smedley ,
Jeffrey W. Keister ,
Erik M. Muller ,
Jean Jordan-Sweet ,
Jen Bohon ,
James Distel  and
Bin Dong
John Smedley
Affiliation:
smedley@bnl.gov, Brookhaven National Laboratory, Instrumentation, Upton, New York, United States
Jeffrey W. Keister
Affiliation:
jkeister@bnl.gov, Brookhaven National Laboratory, NSLS-II, Upton, New York, United States
Erik M. Muller
Affiliation:
emuller@bnl.gov, Stony Brook University, Stony Brook, New York, United States
Jean Jordan-Sweet
Affiliation:
jlj@bnl.gov, IBM, T.J. Watson Research Center, Yorktown Heights, New York, United States
Jen Bohon
Affiliation:
jbohon@bnl.gov, Case Western Reserve University, Center for Synchrotron Biosciences, Upton, New York, United States
James Distel
Affiliation:
jdistel@lanl.gov, Los Alamos National Laboratory, Los Alamos, New Mexico, United States
Bin Dong
Affiliation:
bdong01@bnl.gov, Global Strategies Group, North America, Crofton, Maryland, United States
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Abstract

Single crystal high purity CVD diamonds have been metallized and calibrated as photodiodes at the National Synchrotron Light Source (NSLS). Current mode responsivity measurements have been made over a wide range (0.2-28 keV) of photon energies across several beamlines. Linear response has been achieved over ten orders of magnitude of incident flux, along with uniform spatial response. A simple model of responsivity has been used to describe the results, yielding a value of 13.3±0.5 eV for the mean pair creation energy. The responsivity vs. photon energy data show a dip for photon energies near the carbon edge (284 eV), indicating incomplete charge collection for carriers created less than one micron from the metallized layer.

Keywords

diamonddevicesphotoconductivity
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1203: Symposium J – Diamond Electronics and Bioelectronics-Fundamentals to Applications III , 2009 , 1203-J17-21
Copyright
Copyright © Materials Research Society 2010

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