Hostname: page-component-7bb8b95d7b-l4ctd Total loading time: 0 Render date: 2024-10-01T12:18:22.554Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Defect Imaging in the High Resolution Sem

Published online by Cambridge University Press:  21 February 2011

David C Joy
David C Joy*
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory+, Oak Ridge, TN 37831 and EM Facility, University of Tennessee, Knoxville, TN 37996-0810
Get access

Abstract

The theory of imaging crystallographic defects in solid specimens through the use of electron channeling contrast is reviewed and the necessary conditions for observation are deduced. It is shown that current high performance field emission scanning electron microscopes can meet these requirements and produce dislocation images from suitable materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 183: Symposium E – High Resolution Electron Microscopy of Defects in Materials , 1990 , 199
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hirsch, P B, Howie, A and Whelan, M J, Phil.Mag. 7, 2095 (1962)Google Scholar
2. Coates, D G, Phil.Mag. 16, 1179 (1967)Google Scholar
3. Stem, R M, Ichinokawa, T, Takashima, S, Hashimoto, H and Kimoto, , Phil.Mag. 26, 1495 (1972)Google Scholar
4. Clarke, D R, Phil. Mag. 24, 973 (1971)Google Scholar
5. Joy, D C, Thompson, M N, Booker, G R, and Anderson, W H J, Phys. Stat. Sol., (a), 21, K1 (1974)10.1002/pssa.2210210144Google Scholar
6. Morin, P, Pitaval, M, Besnard, D. and Fontaine, G, Phil.Mag., 40, 511(1979)Google Scholar
7. Hall, C R, and Hirsch, P B, Proc.Roy.Soc., A286, 158 (1965)Google Scholar
8. Hirsch, P B, and Humphreys, C J, in Scanning Electron Microscopy/1970. edited by Johari, O, (IITRI,Chicago, 1970), 449 Google Scholar
9. Clarke, D R, and Howie, A, Phil.Mag., 24, 959 (1971)Google Scholar
10. Humphreys, C J, Spencer, J P, Woolf, R J, Joy, D C, Titchmarsh, J M, and Booker, G R, in Scanning Electron Microscopy /1972, edited by Johari, O., (IITRI,Chicago, 1972), 205 Google Scholar