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Electron Field Emission Characterization of Nanocrystalline Diamond Thin Film Cold Cathode Devices

Published online by Cambridge University Press:  10 February 2011

B. L. Weiss ,
A. Badzian ,
L. Pilione ,
T. Badzian ,
W. Drawl  and
G. Morell
B. L. Weiss
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park PA. 16802 University of Puerto Rico, Rio Piedras Campus, San Juan PR 00931
A. Badzian
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park PA. 16802
L. Pilione
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park PA. 16802
T. Badzian
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park PA. 16802
W. Drawl
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park PA. 16802
G. Morell
Affiliation:
University of Puerto Rico, Rio Piedras Campus, San Juan PR 00931
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Abstract

Electron field emission measurements have been performed on thin film cold cathode materials grown, on molybdenum, by a modified MPACVD diamond process. Specifically the modification is due to the addition of nitrogen and oxygen, in varying ratios, during the diamond growth phase. Characterization using Raman spectroscopy shows features at 1190, 1330 and 1550 cm−1. A simple triode device was fabricated for electron emission characterization. KAPTON® film is used as the insulating layer and a Mo mesh is used as the extraction gate electrode. The collector is an indium tin oxide (ITO) coated glass plate which is positively biased with respect to the gate electrode. Field emission characteristics have shown current measurements of greater than I microamp for fields of 40 V/micron. Gate currents are typically 1000 times greater than the emitted current. Issues currently being addressed include improvement in the total emitted current, current stability and device failure. We also present field emission measurements on diamond films grown by HFCVD.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 593: Symposium U – Amorphous & Nanostructured Carbon , 1999 , 227
Copyright
Copyright © Materials Research Society 2000

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References

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