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Entropy of Atomic Hopping in Diffusion and Defect Transformations

Published online by Cambridge University Press:  28 February 2011

T.W. Dobson ,
J.F. Wager  and
J. A. VAN Vechten
T.W. Dobson
Affiliation:
Tektronix, Inc., Beaverton, OR 97077
J.F. Wager
Affiliation:
Department of Electrical and Computer Engineering, Center for Advanced Materials Research, Oregon State University, Corvallis, Oregon 97331
J. A. VAN Vechten
Affiliation:
Department of Electrical and Computer Engineering, Center for Advanced Materials Research, Oregon State University, Corvallis, Oregon 97331
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Abstract

A formulation for the entropy of vacancy migration based on the ballistic model is proposed and applied quantitatively to explain activation entropies which were previously considered abnormal.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 279
Copyright
Copyright © Materials Research Society 1989

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References

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