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Experimental Method of Determination of Structural Correlations in Surface Layers of Oxide Glass

Published online by Cambridge University Press:  25 February 2011

Zenon BochyŃski
Zenon BochyŃski*
Affiliation:
Non-Crystalline Materials Division, Institute of Physics, Adam Mickiewicz University, 60-780 Poznań 2, Grunwaldzka 6, Poland
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Abstract

A new method of X-ray diffraction analysis of structural inhomogeneities in the quartz/Si02/n based inorganic glasses is presented. The method enables the determination of structural changes occuring in the real nodal lattice in the regions of 10…20 Å or more as well as substructural changes in the regions 5…15 Å comparable to the molecular size of SiO2…SiO4. In consequence these changes can be correlated with approximate nodal lattice models of different degree of ordering. The applied method provided the possibility of constructing structural models of nodal lattices describing the surface and inner layers of the real glasses, changes in the local inhomogeneities as well as boundaries in water-gel associates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 216: Symposium T – Long-Wavelength Semiconductor Devices, Materials and Processes , 1990 , 391
Copyright
Copyright © Materials Research Society 1991

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References

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