Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T08:18:28.328Z Has data issue: false hasContentIssue false
  • English
  • Français

FDTD Simulation of an Open-Ended Metallized Ceramic Probe for Broadband High-Temperature Dielectric Properties Measurements

Published online by Cambridge University Press:  15 February 2011

Shane Bringhurst ,
Magdy F. Iskander  and
Paul Gartside
Shane Bringhurst
Affiliation:
University of Utah, Electrical Engineering Department, Salt Lake City, Utah, 84112
Magdy F. Iskander
Affiliation:
University of Utah, Electrical Engineering Department, Salt Lake City, Utah, 84112
Paul Gartside
Affiliation:
University of Utah, Electrical Engineering Department, Salt Lake City, Utah, 84112
Get access

Abstract

Open-ended coaxial probes have been used in broadband dielectric properties measurements for several years. To aid in the ongoing numerical simulation and microwave sintering research at the University of Utah, we have found it necessary to make dielectric properties measurements up to temperatures as high as 1400 °C. The available cavity perturbation techniques were unsuitable in this application due to their relatively narrow band, and the available metal probes are also unsuitable due to the differential thermal expansions of the inner and outer conductors, which makes it difficult to carry out accurate and on-line calibration procedures for these probes.

To help us achieve both broadband and high-temperature dielectric properties measurements, we have developed a new metallized ceramic coaxial probe. The detailed design of this probe is described and the metallization procedure is discussed.

Also to optimize the design of the probe and in particular to increase the penetration of fields in samples under test and hence improve the probe sensitivity to variation in properties of a larger class of materials, and to determine the required minimum thickness of various samples to obtain accurate results, we modeled and simulated the probe performance using the Finite-Difference Time-Domain (FDTD) method. Results from the FDTD simulation are presented and some guidelines that may be used to optimize the design of the probe are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 221
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Burdette, E. c., Cain, F. L., and Seals, J., “In vivo probe measurement technique for determining dielectric properties at VHF through microwave frequencies”, IEEE Trans., MTT-28, pp. 414–427, 1980 Google Scholar
[2] Tanabe, E., and Joines, W. T., “A nondestructive method for measuring the complex permittivity of dielectric materials at microwave frequencies using an open transmission line resonator”, IEEE Trans. Instrum. Meas., IM-25, pp. 222–226, 1976 Google Scholar
[3] Misra, D., et al., “Noninvasive electrical characterization of materials at microwave frequencies using an open-ended coaxial line: Test of an improved calibration technique”, IEEE Trans., MTT-38, pp. 8–14, 1990 Google Scholar
[4] Andrade, O. M., Iskander, M. F., and Bringhurst, S., “High temperature broadband dielectric properties measurement techniques”, Microwaw Processing of Materials HI, MRS Vol. 269, pp. 527–539, 1992 Google Scholar
[5] Hutcheon, R. M. et al., “RF and microwave dielectric measurements to 1400 °C and dielectric loss mechanisms”, Microwave Processing of Materials HI, MRS Vol. 269, pp. 541–551, 1992 Google Scholar
[6] Bringhurst, S., Iskander, M. F., Andrade, O. M., “High-temperature dielectric properties measurements of ceramics”, Microwave Processing of Materials III, MRS Vol. 269, pp. 561–568, 1992 Google Scholar
[7] Yee, K. S., “Numerical solution of initial boundary-value problems involving Maxwell's equations in isotropie media”, IEEE Trans. Ant. Prop., AP-14, pp. 302–307, 1966 Google Scholar
[8] Iskander, M. F., Smith, R. L., Andrade, O. M., Kimrey, H., and Walsh, L. M., “FDTD simulation of microwave sintering of ceramics in multimode cavities”, IEEE Trans., MTT-42, pp. 793–800, 1994 Google Scholar
[9] Olson, S. C., and Iskander, M. F., “A new in situ procedure for measuring the dielectric properties of low permittivity materials”, IEEE Trans. Instrum. Meas., IM-35, pp. 2–6 1986 Google Scholar
[10] Bringhurst, S., Iskander, M. F., and Andrade, O. M., “New metallized ceramic coaxial probe for high-temperature broadband dielectric properties measurements”, Microwaves: Theory and Application in Materials Processing II, Acers Ceramic Transactions Vol. 36, pp. 503–510 1993 Google Scholar