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A Full-Potential KKR-GREEN's Function Method to Calculate the Electronic Structure of Surfaces

Published online by Cambridge University Press:  25 February 2011

R. Zeller
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich, Postfach 1913, D-5170 Jülich, Federal Republic of Germany
P. Lang
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich, Postfach 1913, D-5170 Jülich, Federal Republic of Germany
B. Drittler
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich, Postfach 1913, D-5170 Jülich, Federal Republic of Germany
P.H. Dederichs
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich, Postfach 1913, D-5170 Jülich, Federal Republic of Germany
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Abstract

We present a multiple-scattering Green's function method to calculate the electronic structure of ideal surfaces and surfaces with point defects. In our method we use the full potential in each atomic cell and describe the surface as a twodimensional defect of the bulk crystal by removing several (three to five) adjacent layers. We have implemented our method within density-functional theory in the local-spin-density approximation and present first results for the Cu (001)-surface, for magnetic monolayers on this surface and for such monolayers in bulk Cu.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Hohenberg, P.C. and Kohn, W., Phys. Rev. 136, B864 (1964); W. Kohn and L.J. Sham, ibid., A1130 (1965); U. von Barth and L. Hedin, J. Phys. C 5, 1629 (1972).CrossRefGoogle Scholar
2. Müller, J.E., Surf. Sci. 178, 589 (1986).CrossRefGoogle Scholar
3. Jepsen, O., Madsen, J., and Andersen, O.K., Phys. Rev. B, 18, 605 (1978); H. Krakauer, M. Posternak, and A.J. Freeman, ibid., 19, 1706 (1979); ibid., 25, 755 (1982); E. Wimmer, H. Krakauer, M. Weinert, and A.J. Freeman, ibid., 24, 864 (1982); D.R. Hamann, L.R. Mattheiss, and H.S. Greenside, ibid., 24, 6151 (1981);M. Weinert, J. Math. Phys., 22, 2433 (1981).Google Scholar
4. Krüger, P. and Pollmann, J., Phys. Rev. Lett., 64, 1808 (1990); Phys. Rev. B, 38, 10578 (1988); P.J. Feibelman, ibid., 35, 2626 (1987); ibid., 42, 729 (1990).CrossRefGoogle Scholar
5. Wenzien, B., Kudrnovsky, J., Drchal, V., and Sob, M., J. Phys.: Condens. Matter, 1, 9893 (1989); H.L. Skriver and N.M. Rosengard, Phys. Rev. B, 43, 9538 (1991).Google Scholar
6. Andersen, O.K. and Jepsen, O., Phys. Rev. Lett., 53, 2571 (1984); O.K. Andersen, Z. Pawlowska, and 0. Jepsen, Phys. Rev. B, 34, 5253 (1986).CrossRefGoogle Scholar
7. Pendry, J., Low Energy Electron Diffraction (Academic Press, London, 1974); F. Maca and M. Scheffler, Comp. Phys. Commun., 51, 381 (1988).Google Scholar
8. Scheffler, M., Droste, Ch., Fleszar, A., Maca, F., Wachutka, G., and Barzel, G., Physica B, 172, 143 (1991).CrossRefGoogle Scholar
9. MacLaren, J.M., Crampin, S., Vvedensky, D.D., and Pendry, J.B., Phys. Rev. B, 40, 12164 (1989); J.M. MacLaren, S. Crampin, D.D. Vvedensky, R.C. Albers, and J.B. Pendry, Comp. Phys. Commun. 60, 365 (1990).CrossRefGoogle Scholar
10. Benesh, G.A. and Inglesfield, J.E., J. Phys. C, 19, L539 (1986); J.E. Inglesfield and G.A. Benesh, Phys. Rev. B, 37, 6682 (1988).CrossRefGoogle Scholar
11. MacLaren, J.M., Zhang, X.-G., Gonis, A., and Crampin, S.: Phys. Rev. B, 40, 9955 (1989).CrossRefGoogle Scholar
12. Zeller, R., J. Phys. C, 20, 2347 (1987).CrossRefGoogle Scholar
13. Williams, A.R. and Morgan, J. van W., J. Phys. C, 7, 37 (1974); R.G. Brown and M. Ciftan, Phys. Rev. B, 39, 3543 (1989).CrossRefGoogle Scholar
14. Zeller, R., Phys. Rev. B, 38, 5993, (1988).CrossRefGoogle Scholar
15. Dederichs, P.H., Drittler, B., and Zeller, R., presented at the 1991 MRS Fall Meeting, Boston, Massachusetts, 1991 (this conference).Google Scholar
16. Lang, P., Diplomarbeit, Technische Hochschule Aachen, 1991.Google Scholar
17. Monkhorst, H.J. and Pack, J.D., Phys. Rev. B, 13, 5188, (1976).CrossRefGoogle Scholar
18. Williams, A.R., Janak, J.F., and Moruzzi, V.L., Phys. Rev. B, 6, 4509, (1972).CrossRefGoogle Scholar
19. Hager, W.W., SIAM Review, 31, 221, (1989).Google Scholar
20. Lasseter, R.H. and Soven, P., Phys. Rev. B, 8, 2476, (1973).CrossRefGoogle Scholar
21. Coleridge, P.T., Molenaar, J., and Lodder, A., J. Phys. C, 15, 6943, (1982).CrossRefGoogle Scholar
22. Blugel, S., Weinert, M., and Dederichs, P.H., Phys. Rev. Lett., 60, 1077 (1988); S. BlOgel, B. Drittler, R. Zeller, and P.H. Dederichs, Appl. Phys. A, 49, 547, (1989). 23. C.L. Fu and A.J. Freeman, Phys. Rev. B, 35, 925, (1987).Google Scholar
24. Wang, C.S., Freeman, A.J., and Krakauer, H., Phys. Rev. B, 24, 1126, (1981).CrossRefGoogle Scholar
25. Krutzen, B.C.H., PhD thesis, University of Nijmegen, 1990.Google Scholar