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Giant Magnetoresistance in Co/Ag Multilayers

Published online by Cambridge University Press:  03 September 2012

M. Tan ,
J. A. Barnard ,
M. R. Parker  and
D. Seale
M. Tan
Affiliation:
Department of metallurgical and Materials Engineering, The University of Alabama
J. A. Barnard
Affiliation:
Department of metallurgical and Materials Engineering, The University of Alabama
M. R. Parker
Affiliation:
Department Of Electrical Engineering, Tuscaloosa, AL 35487–0202, The University of Alabama
D. Seale
Affiliation:
Department Of Electrical Engineering, Tuscaloosa, AL 35487–0202, The University of Alabama
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Abstract

The Magnetoresistance (MR), Magnetic properties, and crystal structure of dc magnetron sputtered CO/Ag periodic multilayers have been investigated. The Co layer thickness was fixed at -30 Å while the thickness of the Ag layer was systematically varied. ‘Giant’ magnetoresistance was observed. The MR ratio has been found to decline monotonically with increasing Ag thickness in the range 30 Å to 107 Å. Although the maximum room temperature MR ratio is a Modest 4.78%, a more technologically significant measurement of field sensitivity (MR ratio/FWHM of the MR vs. H peak) is a promising 0.1%/Oe at its best. The effect of the number of bilayer units has also been examined and no substantial differences were noted between multilayers containing 8, 9, and 10 bilayer units. Coercivities as determined by both magnetometer and the splitting of the MR peaks are in agreement and increase from 25 to 38 Oe with increasing Ag thickness. Evidence for antiferromagnetic coupling is apparent in the hysteresis loops. High angle X-ray diffractometry (HXRD) in the θ-2θ mode revealed a strong Ag (111) texture in the film, with satellite peaks indicating a layered structure. Low angle XRD (LXRD) also yielded broad superlattice peaks in all samples at least to the second order.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 313: Symposium Q1 – Magnetic Ultrathin Films, Multilayers and Surfaces/Magnetic Interfaces-Physics and Characterizations , 1993 , 191
Copyright
Copyright © Materials Research Society 1993

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References

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