Article contents
Grain Boundaries in NiO†
Published online by Cambridge University Press: 25 February 2011
Abstract
Defocus-imaging and high-resolution electron microscopy (HREM) are used to study tilt grain boundaries (GB) in NiO near the <001> axis over the whole range of possible misorientation. Faceting and structural periodicities within facets are observed in high- and low-angle GBs. A reduced atomic density at high-angle GBs is suggested by the defocus behavior.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1985
Footnotes
Work supported by the U.S. Department of Energy.
References
- 5
- Cited by